Математична шумова модель інтегральних операційних підсилювачів для прогнозування надійності за рівнем низькочастотного шуму

Abstract

The mathematical noise model of operational amplifiers is offered, for forecast of their reliability by the level of low-frequency noise on the stage of manufacture and input control. Research of this model showed that the level of noise voltage was higher in devices with p-n-insulation, and also it was showed considerable influence exercised by the level of input current.