| dc.contributor.author | Vasilevskyi, O. M. | en |
| dc.contributor.author | Васілевський, О. М. | uk |
| dc.date.accessioned | 2017-09-24T16:07:13Z | |
| dc.date.available | 2017-09-24T16:07:13Z | |
| dc.date.issued | 2014 | |
| dc.identifier.citation | Vasilevskyi O. M. Metrological certification of measuring instruments according to the concept uncertainty of measurement [Text] // XII Міжнародна конференція “Контроль і управління в складних системах” (КУСС-2014), Вінниця, 14-16 жовтня 2014 р. – Вінниця : ВНТУ. – 2014. – С. 75. | en |
| dc.identifier.uri | http://ir.lib.vntu.edu.ua//handle/123456789/18216 | |
| dc.description.abstract | It is accepted that measurement instruments are technical devices which are characterised by
standardised metrological characteristics. The reliability of measurement devices is determined by their
ability to withstand the metrological parameters of regulated limits. A result obtained beyond these set
boundaries is classified as a metrological failure. The correspondence of metrological characteristics to
their standardised values is established during the course of verification (metrological control) or
metrological certification of measurement devices. | en |
| dc.language.iso | uk_UA | uk_UA |
| dc.publisher | ВНТУ | uk |
| dc.relation.ispartof | XII Міжнародна конференція “Контроль і управління в складних системах” (КУСС-2014), Вінниця, 14-16 жовтня 2014 р. : 75. | uk |
| dc.subject | metrological certification | en |
| dc.subject | uncertainty of measurement | en |
| dc.subject | technical devices | en |
| dc.title | Metrological certification of measuring instruments according to the concept uncertainty of measurement | en |
| dc.type | Article | |
