Аналітичні основи поляризаційного картографування багатошарових двопромене- заломлюючих полікристалічних мереж

Abstract

The relationship between the Mueller-matrix and polarization mapping of the multilayer birefringent networks considered. Based on modeling of coordinate distributions of azimuths and ellipticity are revealed the relationship between their statistics, correlation and fractal characteristics as the number of layers. The proposal results may be the basis for developing criteria for the differentiation of the optical properties of polycrystalline multilayer networks.