Показати скорочену інформацію

dc.contributor.authorOvcnynnykov, K. V.en
dc.contributor.authorVasilevskyi, O. M.en
dc.contributor.authorSevastianov, V. M.en
dc.contributor.authorPolievoda, Y. A.en
dc.contributor.authorKalizhanova, A.en
dc.contributor.authorYeraliyeva, B.en
dc.contributor.authorОвчинников, К. В.uk
dc.contributor.authorВасілевський, О. М.uk
dc.contributor.authorСевастьянов, В. М.uk
dc.contributor.authorПолієвода, Ю. А.uk
dc.contributor.authorКаліжанова, А.uk
dc.contributor.authorЄралієва, Б.uk
dc.date.accessioned2022-09-07T11:29:48Z
dc.date.available2022-09-07T11:29:48Z
dc.date.issued2022
dc.identifier.citationDetermination of the optimal frequency of the primary measuring transducer of the thickness of dielectric coatings of metal surfaces [Text] / K. Ovcnynnykov, O. Vasilevskyi, V. Sevastianov [etc.] // Informatyka, Automatyka, Pomiary W Gospodarce I Ochronie Środowiska. – 2022. – 12(2). – P. 56-59.en
dc.identifier.issn2083-0157
dc.identifier.urihttp://ir.lib.vntu.edu.ua//handle/123456789/35771
dc.description.abstractThe article provides an analysis of the physical processes underlying the operation of the measuring transducer, with a time based information presentation. A mathematical model is developed that describes the process of free oscillation attenuation excited in the LC-contour of primary measuring transducer, and analyzes and evaluates the influence of external factors that influence the measurement results. The ways of elimination of their influence on the results of measuring control are offered.en
dc.language.isoenen
dc.publisherPolitechnika Lubelskaen
dc.relation.ispartofInformatyka, Automatyka, Pomiary W Gospodarce I Ochronie Środowiska. 12(2) : 56-59.pl
dc.relation.urihttp://doi.org/10.35784/iapgos.2948
dc.subjectmeasuringen
dc.subjecttransduceren
dc.subjectthicknessen
dc.subjectdielectric coatingen
dc.subjectmetal surfaceen
dc.subjectoscillationen
dc.titleDetermination of the optimal frequency of the primary measuring transducer of the thickness of dielectric coatings of metal surfacesen
dc.typeArticle
dc.identifier.doi10.35784/iapgos.2948


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Показати скорочену інформацію